FTIR Spectrometers | Sciencetech Inc.

FTIR Spectrometers

Benchtop FTIR spectrometers are a robust method to characterize reflection, transmission, and absorption of light within the wavenumber range from 14000/cm to 400/cm.

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The TEO-402 is a compact Michelson interferometer module with built-in laser and a broadband IR source. It is designed to be used as a core component in a complete FTIR instrument.
Note that this system does not include a power supply, AD board, or detector.
10,238.00
In stock
The TEO-402 is a compact Michelson interferometer module with built-in laser and a broadband IR source. It is designed to be used as a core component in a complete FTIR instrument.
Note that this system does not include a power supply, AD board, or detector.
10,238.00 10238.0 USD
Price Valid only in North America


The TEO-402 is a compact Michelson interferometer module with built-in laser and a broadband IR source. It is designed to be used as a core component in a complete FTIR instrument.
Note that this system does not include a power supply, AD board, or detector.
11,288.00
In stock
The TEO-402 is a compact Michelson interferometer module with built-in laser and a broadband IR source. It is designed to be used as a core component in a complete FTIR instrument.
Note that this system does not include a power supply, AD board, or detector.
11,288.00 11288.0 USD
Price Valid only in North America


The Model TEO200 benchtop FTIR spectrometer is a low cost Fourier transform infrared spectrometer that employs a number of unique features to achieve high performance from such a compact size. At just 385x265x160mm , it is one of the most compact FTIR systems on the market today.
The TEO200 is unique in terms of its optical geometry and software/firmware design. The optical geometry is simplified by employing a new and remarkably compact Michelson self compensating optical system that eliminates many of the optical alignment problems found in conventional linear and pendulum type optical interferometers. For example, the TEO200 design avoids the use of conventional corner cube optics and dynamic alignment. In practical terms, the instrument can be used inside a research laboratory, or even as a mobile unit in outside environments. Its software and firmware design is also tightly coordinated which significantly reduces overall data acquisition and computational time.
The sealed, desiccated enclosure of the TEO200 eliminates the need for continuous dry nitrogen purging during operation. Other notable features include an air cooled IR source as oppose to water cooled, and the interferometer mechanical bearing does not require gas supply. There are however, three dry nitrogen gas inlets on the rear of the spectrometer for the purging of the detector compartment, sample compartment, and interferometer compartment from moisture, carbon dioxide and other gases.

Please note that there are a variety of spectral ranges available, depending on the detector-beam splitter choices for the system. The price of the system includes this beam splitter, but it must be specified.
KBr 7,000 to 400 cm-1
ZnSe 5,000 to 500 cm-1
CaF2 10,000 to 1,000 cm-1
Quartz 15,000 to 3,000 cm-1
15,698.00
In stock
The Model TEO200 benchtop FTIR spectrometer is a low cost Fourier transform infrared spectrometer that employs a number of unique features to achieve high performance from such a compact size. At just 385x265x160mm , it is one of the most compact FTIR systems on the market today.
The TEO200 is unique in terms of its optical geometry and software/firmware design. The optical geometry is simplified by employing a new and remarkably compact Michelson self compensating optical system that eliminates many of the optical alignment problems found in conventional linear and pendulum type optical interferometers. For example, the TEO200 design avoids the use of conventional corner cube optics and dynamic alignment. In practical terms, the instrument can be used inside a research laboratory, or even as a mobile unit in outside environments. Its software and firmware design is also tightly coordinated which significantly reduces overall data acquisition and computational time.
The sealed, desiccated enclosure of the TEO200 eliminates the need for continuous dry nitrogen purging during operation. Other notable features include an air cooled IR source as oppose to water cooled, and the interferometer mechanical bearing does not require gas supply. There are however, three dry nitrogen gas inlets on the rear of the spectrometer for the purging of the detector compartment, sample compartment, and interferometer compartment from moisture, carbon dioxide and other gases.

Please note that there are a variety of spectral ranges available, depending on the detector-beam splitter choices for the system. The price of the system includes this beam splitter, but it must be specified.
KBr 7,000 to 400 cm-1
ZnSe 5,000 to 500 cm-1
CaF2 10,000 to 1,000 cm-1
Quartz 15,000 to 3,000 cm-1
15,698.00 15698.0 USD
Price Valid only in North America


The TEO-200-X series of FTIR spectrometers represent a low cost Fourier transform infrared spectrometers and employ a number of unique features that ensure high performance from a compact instrument. The 200-X measures just 59 X 39 X 19 cm and is regarded as one of the most compact and versatile infrared FTIR spectrophotometers. The design of the 200-X is unique both in terms of optical design and the software and firmware designed specifically to significantly reduce overall analytical times. The interferometer geometry employs a new compact Michelson self compensating optical system that eliminates many of the optical alignment problems found in conventional type optical interferometers. The 200-X design avoids the use of conventional corner cube optics and dynamic alignment. In practice this means that the instrument can be used in the research laboratory, in any university or college environment and if required, can also be used outside laboratory or in remote locations.

The sample compartment is large and can accommodate all of the normal sample handling requirements relating to FTIR spectroscopy. This unique compartment will also accommodate a wide range of accessories supplied by specialist accessory manufacturers. Overall dimensions are W20 X D26 X H16 cm . The optical axis is 74.5 mm above the base of the sample compartment and there is free space of 90 mm above the optical axis to the underside of the lid.

In order to facilitate the use of more than one beam splitter or detector , provisions have been made to interchange the beam splitter and detector assemblies allowing the 200-X to be used at any wavelength from 15000 to 400 cm-1.

Beam Splitters Range subject to coatings
KBr 7,800 to 380 cm-1
ZnSe 5,000 to 500 cm-1
Fused silica 15,000 to 3,000 cm-1
17,500.00
In stock
The TEO-200-X series of FTIR spectrometers represent a low cost Fourier transform infrared spectrometers and employ a number of unique features that ensure high performance from a compact instrument. The 200-X measures just 59 X 39 X 19 cm and is regarded as one of the most compact and versatile infrared FTIR spectrophotometers. The design of the 200-X is unique both in terms of optical design and the software and firmware designed specifically to significantly reduce overall analytical times. The interferometer geometry employs a new compact Michelson self compensating optical system that eliminates many of the optical alignment problems found in conventional type optical interferometers. The 200-X design avoids the use of conventional corner cube optics and dynamic alignment. In practice this means that the instrument can be used in the research laboratory, in any university or college environment and if required, can also be used outside laboratory or in remote locations.

The sample compartment is large and can accommodate all of the normal sample handling requirements relating to FTIR spectroscopy. This unique compartment will also accommodate a wide range of accessories supplied by specialist accessory manufacturers. Overall dimensions are W20 X D26 X H16 cm . The optical axis is 74.5 mm above the base of the sample compartment and there is free space of 90 mm above the optical axis to the underside of the lid.

In order to facilitate the use of more than one beam splitter or detector , provisions have been made to interchange the beam splitter and detector assemblies allowing the 200-X to be used at any wavelength from 15000 to 400 cm-1.

Beam Splitters Range subject to coatings
KBr 7,800 to 380 cm-1
ZnSe 5,000 to 500 cm-1
Fused silica 15,000 to 3,000 cm-1
17,500.00 17500.0 USD
Price Valid only in North America
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